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Analysis of electronic circuit connections

Property	Value
dbo:description	Analysis of electronic circuit connections (en) یک فن تحلیلی مخرب است که بر روی قطعات فناوری نصب-سطحی برای انجام تحلیل خرابی یا بررسی یکپارچگی اتصال لحیم (fa)
dbo:wikiPageWikiLink	dbr:Electroless_nickel_immersion_gold dbc:Product_testing dbr:Destructive_testing dbc:Reliability_engineering dbr:Shock_(mechanics) dbr:Thermal_shock dbc:Engineering_failures dbc:Nondestructive_testing dbc:Semiconductor_devices dbr:Integrated_circuit dbr:Solder dbr:Ball_grid_array dbr:Failure_of_electronic_components dbr:Pad_cratering dbr:Dye dbr:Surface-mount_technology dbc:Chip_carriers dbr:Printed_circuit_board dbr:Dye_penetrant_inspection dbr:Failure_analysis dbc:Digital_electronics dbc:Electronic_design dbc:Mechanical_tests dbc:Electronics_manufacturing dbc:Integrated_circuits dbr:Temperature_cycling dbc:Semiconductor_analysis dbr:Cross_section_(electronics) dbr:Solder_Fatigue
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dct:subject	dbc:Product_testing dbc:Reliability_engineering dbc:Engineering_failures dbc:Nondestructive_testing dbc:Semiconductor_devices dbc:Chip_carriers dbc:Digital_electronics dbc:Electronic_design dbc:Mechanical_tests dbc:Electronics_manufacturing dbc:Integrated_circuits dbc:Semiconductor_analysis
rdfs:label	Dye-and-pry (en)
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